Spectroscopic study of resonant dielectric structures in near-field

Authors
Davy, S Barchiesi, D Spajer, M Courjon, D
Citation
S. Davy et al., Spectroscopic study of resonant dielectric structures in near-field, EPJ-APPL PH, 5(3), 1999, pp. 277-281
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN journal
12860042 → ACNP
Volume
5
Issue
3
Year of publication
1999
Pages
277 - 281
Database
ISI
SICI code
1286-0042(199903)5:3<277:SSORDS>2.0.ZU;2-Q
Abstract
Gratings can be considered as resonant structures in near-field. The enhanc ement of the intensity recorded by Scanning Near-Field Optical Microscopes (SNOM) is due to interferences in relation with the ratio of the wavelength to the product of the optical index by the period of the grating; We discu ss the effect of this ratio (in the range 0.9, 1.1) on the intensity patter ns. The influence of the polarization on near-field data is analyzed in bot h theoretical computations and experimental result.