Magneto-optical Faraday imaging with an apertureless scanning near field optical microscope

Citation
H. Wioland et al., Magneto-optical Faraday imaging with an apertureless scanning near field optical microscope, EPJ-APPL PH, 5(3), 1999, pp. 289-295
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS
ISSN journal
12860042 → ACNP
Volume
5
Issue
3
Year of publication
1999
Pages
289 - 295
Database
ISI
SICI code
1286-0042(199903)5:3<289:MFIWAA>2.0.ZU;2-3
Abstract
We have developed an apertureless Scanning Wear field Optical Microscope (S NOM) in transmission, devoted to near field magneto-optics. Our apertureles s SNOM combines an inverted optical microscope, which has been adapted to F araday effect imaging, with a commercial stand-alone Scanning Probe Microsc ope, used in Atomic Force Microscope (AFM) mode. Two different probes are v alidated as apertureless SNOM tips: a home-made etched tungsten wire and a commercial AFM silicon probe. We present and analyze preliminary images of the domain structure in iron garnets. They indicate a SNOM resolution clear ly in the sub-micrometric range. Besides, the near field magneto-optical im age presents some unexpected features, not revealed in far field images.