Raman studies of heavily carbon doped GaAs

Citation
M. Seon et al., Raman studies of heavily carbon doped GaAs, J APPL PHYS, 85(10), 1999, pp. 7224-7230
Citations number
50
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
10
Year of publication
1999
Pages
7224 - 7230
Database
ISI
SICI code
0021-8979(19990515)85:10<7224:RSOHCD>2.0.ZU;2-7
Abstract
Raman spectroscopy is used to study GaAs heavily doped with carbon. Hole co ncentrations in these samples range from 2.3X10(19) to 1X10(20) cm(-3). Thr ee main Raman features are investigated: the longitudinal-optic (LO) phonon mode, the substitutional carbon-at-arsenic local-vibrational mode, and the coupled plasmon-LO phonon present due to the interaction between the LO ph onon and the free carriers. Only one allowed phonon-like coupled mode is ob served due to the large plasmon damping and high effective carrier masses. The coupled mode is seen to systematically redshift as carrier concentratio n increases. This behavior is described by a model which includes the effec ts of high hole concentrations on the dielectric function and an additional shift in the optic phonon we tentatively attribute to carbon size effect. The local vibrational mode intensity is found to be directly proportional t o the carrier concentration p. Interestingly, the local mode intensity show s good correlation with that of the coupled plasmon-LO phonon mode as a fun ction of p. The ratio of the coupled plasmon-LO phonon mode intensity to th at of the LO phonon is found to be directly proportional to the carrier con centration. (C) 1999 American Institute of Physics. [S0021-8979(99)03710-X] .