In-plane ferromagnetic resonance (FMR) has been used to study the room-temp
erature linewidth Delta H of single crystal Fe films grown by dc magnetron
sputtering onto MgO(100) substrates. Several samples were grown with the fi
lm thickness in the range 70 Angstrom < t(Fe) < 250 Angstrom. The measureme
nts were carried out in the frequency range from 7.0 to 12.3 GHz. A phenome
nological model for the FMR linewidth was developed that includes simultane
ous effects due to intrinsic damping and angular dispersions of the cubic a
nd uniaxial axes of anisotropy. These angular dispersions are found to be r
esponsible for the relatively larger linewidths observed as a function of t
he in-plane field direction with fixed frequency, and as a function of freq
uency for the easy and hard directions as well. The behavior of the linewid
th with the film thickness can be described by a sum of a constant volume t
erm plus a term proportional to 1/t(Fe), representing the relaxation due to
the misfit dislocations. (C) 1999 American Institute of Physics. [S0021-89
79(99)02009-5].