Ferromagnetic resonance linewidth and anisotropy dispersions in thin Fe films

Citation
Jr. Fermin et al., Ferromagnetic resonance linewidth and anisotropy dispersions in thin Fe films, J APPL PHYS, 85(10), 1999, pp. 7316-7320
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
10
Year of publication
1999
Pages
7316 - 7320
Database
ISI
SICI code
0021-8979(19990515)85:10<7316:FRLAAD>2.0.ZU;2-B
Abstract
In-plane ferromagnetic resonance (FMR) has been used to study the room-temp erature linewidth Delta H of single crystal Fe films grown by dc magnetron sputtering onto MgO(100) substrates. Several samples were grown with the fi lm thickness in the range 70 Angstrom < t(Fe) < 250 Angstrom. The measureme nts were carried out in the frequency range from 7.0 to 12.3 GHz. A phenome nological model for the FMR linewidth was developed that includes simultane ous effects due to intrinsic damping and angular dispersions of the cubic a nd uniaxial axes of anisotropy. These angular dispersions are found to be r esponsible for the relatively larger linewidths observed as a function of t he in-plane field direction with fixed frequency, and as a function of freq uency for the easy and hard directions as well. The behavior of the linewid th with the film thickness can be described by a sum of a constant volume t erm plus a term proportional to 1/t(Fe), representing the relaxation due to the misfit dislocations. (C) 1999 American Institute of Physics. [S0021-89 79(99)02009-5].