Realization of epitaxial barium ferrite films of high crystalline quality with small resonance losses

Citation
Sr. Shinde et al., Realization of epitaxial barium ferrite films of high crystalline quality with small resonance losses, J APPL PHYS, 85(10), 1999, pp. 7459-7466
Citations number
27
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
10
Year of publication
1999
Pages
7459 - 7466
Database
ISI
SICI code
0021-8979(19990515)85:10<7459:ROEBFF>2.0.ZU;2-M
Abstract
We report the results of systematic studies of the effect of thin film depo sition conditions, such as deposition temperature, oxygen pressure during d eposition, etc., on the microstructural, magnetic, and microwave properties of pulsed laser deposited epitaxial thin films of barium ferrite on single crystal sapphire substrates. Ferromagnetic resonance (FMR) linewidths are very sensitive to the presence of defects and inhomogeneities and therefore change markedly with the variation of deposition parameters. After careful optimization of the deposition conditions, relatively narrow resonance lin es were realized in these films. For further improvement in the film qualit y, these films were annealed at elevated temperatures in flowing oxygen. As a result of the high degree of epitaxy, good stoichiometry, and reduced co ncentration of defects, FMR linewidths as small as 37 Oe were obtained in f ilms deposited at 920 degrees C and subsequently annealed at 1000 degrees C in an oxygen atmosphere. (C) 1999 American Institute of Physics. [S0021-89 79(99)04806-9].