PIXE and PIXE-induced XRF for chemical specification

Wavelength dispersive X-ray spectra with fine structures in the PIXE and PI XE-induced XRF spectra have been proved to be very much useful for chemical specification of condensed matters. The fine structures have been reproduc ed theoretically by introducing molecular orbital calculations, the shake-o ff and resonant orbital rearrangement (ROR) processes, together with the di rect Coulomb interaction between projectiles and target atoms, and the self -absorption of emitted X-rays through the targets. Comparison between obser ved and theoretical spectra is given here for F and S atoms. (C) 1999 Elsev ier Science B.V. All rights reserved.