High-resolution PIXE instrumentation survey. Part II

Authors
Petukhov, VP Terasawa, M Torok, I
Citation
Vp. Petukhov et al., High-resolution PIXE instrumentation survey. Part II, NUCL INST B, 150(1-4), 1999, pp. 103-108
Citations number
71
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
150
Issue
1-4
Year of publication
1999
Pages
103 - 108
Database
ISI
SICI code
0168-583X(199904)150:1-4<103:HPISPI>2.0.ZU;2-6
Abstract
High-resolution PIXE facilities (X-ray crystal spectrometers working on ion beams of accelerators) and their applications in chemical analysis and in basic research are surveyed. (C) 1999 Elsevier Science B.V. All rights rese rved.