PIXE and RES as a tool for the analysis of historic copper halfpennies

Citation
Mh. Abraham et al., PIXE and RES as a tool for the analysis of historic copper halfpennies, NUCL INST B, 150(1-4), 1999, pp. 651-655
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
150
Issue
1-4
Year of publication
1999
Pages
651 - 655
Database
ISI
SICI code
0168-583X(199904)150:1-4<651:PARAAT>2.0.ZU;2-F
Abstract
RES and PIXE microbeam analysis is used to investigate the trace element co ncentrations as well as the surface corrosion of counterfeited copper halfp ennies from the mid 18th century. PIXE elemental mapping was used to identi fy regions with a minimum of light element contamination which could be use d for accurate trace element determinations. RES analysis of selected point s on the map could be used to confirm the absence of corrosion or contamina tion, and in addition yielded valuable information on the composition and s tructure of the corrosion layers. (C) 1999 Elsevier Science B.V. All rights reserved.