EXTENDED ANALYSIS OF INTENSITY ANOMALIES IN THE AL-I ISOELECTRONIC SEQUENCE

Citation
L. Engstrom et al., EXTENDED ANALYSIS OF INTENSITY ANOMALIES IN THE AL-I ISOELECTRONIC SEQUENCE, Physica scripta. T, 52(5), 1995, pp. 516-521
Citations number
21
Categorie Soggetti
Physics
Journal title
ISSN journal
02811847
Volume
52
Issue
5
Year of publication
1995
Pages
516 - 521
Database
ISI
SICI code
0281-1847(1995)52:5<516:EAOIAI>2.0.ZU;2-3
Abstract
This paper reports an extended experimental investigation, using the b eam-foil technique, of the intensity ratio of the fine-structure compo nents in the 3s(2)3p P-2(1/2, 3/2) 3s3p(2) S-2(1/2) and P-2(1/2) reson ance transitions along the A1I isoelectronic sequence. These intensity ratios are strongly influenced by cancellation/enhancement effects ar ising from spin-orbit induced level mixings, and are thus sensitive pr obes of the detailed atomic structure. New data are given for Si II, P III, S IV, K VII, Sc IX, Fe XIV and Ni XVI. Together with previous ex perimental results this comprehensive isoelectronic study reveals sign ificant and systematic deviations from theoretical predictions.