Nanoscopic crystallography of chalcopyrite CuInS2 by techniques of convergent-beam electron diffraction

Citation
M. Leicht et al., Nanoscopic crystallography of chalcopyrite CuInS2 by techniques of convergent-beam electron diffraction, PHIL MAG A, 79(5), 1999, pp. 1033-1043
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS ANDMECHANICAL PROPERTIES
ISSN journal
13642804 → ACNP
Volume
79
Issue
5
Year of publication
1999
Pages
1033 - 1043
Database
ISI
SICI code
1364-2804(199905)79:5<1033:NCOCCB>2.0.ZU;2-0
Abstract
We investigate the crystallography of CuInS2 single crystals on a nanoscopi c scale in space by transmission electron microscopy. We combine several co nvergent-beam electron diffraction techniques (CBED). Microdiffraction, a v ariant of CBED with a moderate convergent beam, is used for a space-group a nalysis. The arrangements of so-called defect and excess lines as visible i n (000) and high-order Laue zone CBED discs are utilized for the determinat ion of the lattice parameters and for the exact atom positions within the c rystallographic unit cell respectively. Therefore the experimental CBED pat terns are compared with simulations based on the dynamical diffraction theo ry. These investigations reveal the analysed CuInS2 material to be a reliab le model substance for chalcopyrites (contrary to CuInSe2). We utilize this model substance to determine reflections that occur owing to 'Umweganregun gen'. The unambiguous identification of such reflections is indispensable f or the differentiation between chalcopyrites and related crystal structures .