Born in the early 1980s to study magnetic films, polarized neutron reflecto
metry (PNR) has enjoyed growing popularity as witnessed by the number of in
struments assembled at neutron research centers. PNR has proved its usefuln
ess by providing information as diverse as the penetration depth of the mag
netic field in superconductors and the absolute value of the magnetic momen
ts in ultrathin ferromagnetic layers; yet its widest application has become
the study of the magnetic configurations in multilayers. Two types of refl
ectometers have been constructed: time of flight and crystal analyzer. The
relative merits of the two types are discussed in the light of present and
future applications, (C) 1999 Published by Elsevier Science B.V.