Phase-retrieval X-ray diffractometry in the case of high- or low-flux radiation source

An experimental-analytical technique for X-ray phase retrieval in the case of high- or low-flux radiation source is considered. Experimentally measura ble reflectivity magnitudes, using a rotating anode or conventional X-ray t ube source, affect the directly reconstructed profile of the complex crysta l structure factor. Thermal and point defect diffuse scattering contaminate s the rails of the Bragg diffracted intensity A numerical procedure develop ed for the regularization of the directly reconstructed complex structure f actor allows one to eliminate parasitic fringes in the resulting crystal-la ttice strain profiles. The stability of the phase-reconstruction technique to experimental intensity measured in a different range of reflectivity val ues is discussed.