Nanometer focusing of hard x rays by phase zone plates

Citation
W. Yun et al., Nanometer focusing of hard x rays by phase zone plates, REV SCI INS, 70(5), 1999, pp. 2238-2241
Citations number
17
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
70
Issue
5
Year of publication
1999
Pages
2238 - 2241
Database
ISI
SICI code
0034-6748(199905)70:5<2238:NFOHXR>2.0.ZU;2-8
Abstract
Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respect ively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabr ication of the PZP and its experimental characterization are presented and some special applications are discussed. (C) 1999 American Institute of Phy sics. [S0034-6748(99)02705-7].