Spline wavelet in the resolution of overlapping voltammetric peaks

Citation
Xp. Zheng et al., Spline wavelet in the resolution of overlapping voltammetric peaks, SCI CHINA B, 42(2), 1999, pp. 145-152
Citations number
15
Categorie Soggetti
Chemistry
Journal title
SCIENCE IN CHINA SERIES B-CHEMISTRY
ISSN journal
1001652X → ACNP
Volume
42
Issue
2
Year of publication
1999
Pages
145 - 152
Database
ISI
SICI code
1001-652X(199904)42:2<145:SWITRO>2.0.ZU;2-W
Abstract
Spline wavelet transform is used to resolve overlapping voltammetric peaks. A suitable resolving factor is chosen to multiply the filters of spline wa velet and make it a peak resoluter. Simulated overlapping voltammetric peak s are processed by the peak resoluter and satisfactory results are obtained . Base-line separation can be achieved, the relative errors of peak positio n are less than 3.0%, and the relative errors of peak area are less than 5. 0%. The effect of different resolving factors and spline wavelet basis are discussed. To lest the procedure, two systems, cadmium (II)indium (III) and lead (II)-thallium (I), are used.