The de current-voltage characteristics of thin films of the metal chalcogen
ide glassy semiconductor Se100-x In-x with 3 less than or equal to X less t
han or equal to 15 using a square four-point probe of silver paste were obt
ained. Results showed a nearly ohmic behaviour. The resistance obeyed an Ar
henius-type dependence on the ambient temperature. The optical band gap was
determined and found to be in the range 1.5-1.75 eV and arose from indirec
t transitions. The electrical activation energy lies in the range 0.79-1.02
eV. The electrical and optical data were consistent and realized by bindin
g energy represented by the cohesive energy values. The generalised "8 - n"
rule was used to estimate the average co-ordination number. Obtained resul
ts were treated in the frame of the chemical bond approach proposed by Bice
rano and Ovshinsky (Non-Cryst. solids, 1985; 74:75). Also, it was observed
that the prepared films are almost stable against gamma-dose up to 10 Mrad.
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