Vf. Kabanov et Am. Sverdlova, POSITIVE MAGNETORESISTANCE IN FILMS OF THE FERROMAGNETIC SEMICONDUCTOR EU1-XSMXO, Semiconductors, 31(5), 1997, pp. 531-533
The positive magnetoresistance effect in a film of the ferromagnetic s
emiconductor Eu1-xSmxO has been studied; this effect is not characteri
stic of materials of this class. The effect of the external magnetic a
nd electric fields and temperature on the positive magnetoresistance w
as investigated. It is shown that the magnitude of the magnetoresistan
ce Delta rho/rho(0) is determined by scattering of free charge carrier
s by spatial fluctuations of the magnetization which are due to the no
nuniform distribution of defects in the structurally disordered system
(quasiamorphous film). (C) 1997 American Institute of Physics.