POSITIVE MAGNETORESISTANCE IN FILMS OF THE FERROMAGNETIC SEMICONDUCTOR EU1-XSMXO

Citation
Vf. Kabanov et Am. Sverdlova, POSITIVE MAGNETORESISTANCE IN FILMS OF THE FERROMAGNETIC SEMICONDUCTOR EU1-XSMXO, Semiconductors, 31(5), 1997, pp. 531-533
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
10637826
Volume
31
Issue
5
Year of publication
1997
Pages
531 - 533
Database
ISI
SICI code
1063-7826(1997)31:5<531:PMIFOT>2.0.ZU;2-P
Abstract
The positive magnetoresistance effect in a film of the ferromagnetic s emiconductor Eu1-xSmxO has been studied; this effect is not characteri stic of materials of this class. The effect of the external magnetic a nd electric fields and temperature on the positive magnetoresistance w as investigated. It is shown that the magnitude of the magnetoresistan ce Delta rho/rho(0) is determined by scattering of free charge carrier s by spatial fluctuations of the magnetization which are due to the no nuniform distribution of defects in the structurally disordered system (quasiamorphous film). (C) 1997 American Institute of Physics.