Roundtable: IC reliability and test: What will deep submicron bring?

Authors
Hawkins, CF Baker, K Butler, K Figueras, J Nicolaidis, M Rao, V Roy, R Welsher, T
Citation
Cf. Hawkins et al., Roundtable: IC reliability and test: What will deep submicron bring?, IEEE DES T, 16(2), 1999, pp. 84-91
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
16
Issue
2
Year of publication
1999
Pages
84 - 91
Database
ISI
SICI code
0740-7475(199904/06)16:2<84:RIRATW>2.0.ZU;2-Y