Wide-band high-efficiency optical-to-electrical conversion stimulus probe heads for testing large-signal responses of high-speed electronic devices

Wide-band high-efficiency optical-to-electrical conversion stimulus probe h eads have been developed for testing large-signal responses of high-speed e lectronic devices, Two types of such probes were demonstrated using a 155-m u m 85-GHz-bandwidth waveguide p-i-n photodiode, The type-I probe employs a simple semirigid coaxial cable with a bias network for the electrical-sign al transmission, resulting in a very low modal dispersion of <1.0 ps, The h ighest -3-dB bandwidth of 60 GHz was obtained for an output voltage of 250 mV(p-p), and was maintained beyond 50 GHz for output voltages of up to 400 mV(p-p). The type-II probe employs a broad-band InP high electron-mobility transistor distributed amplifier that boosts the electrical output signal a mplitude over 1 Vp-p. The -3-dB bandwidth is 40 (35) GHz for output voltage s up to 500 (1000) mV(p-p).