Symmetry detection by generalized complex (GC) moments: A close-form solution

Citation
Dg. Shen et al., Symmetry detection by generalized complex (GC) moments: A close-form solution, IEEE PATT A, 21(5), 1999, pp. 466-476
Citations number
28
Categorie Soggetti
AI Robotics and Automatic Control
Journal title
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
ISSN journal
01628828 → ACNP
Volume
21
Issue
5
Year of publication
1999
Pages
466 - 476
Database
ISI
SICI code
0162-8828(199905)21:5<466:SDBGC(>2.0.ZU;2-9
Abstract
This paper presents a unified method for detecting both reflection-symmetry and rotation-symmetry of 2D images based on an identical set of features, i.e., the first three nonzero generalized complex (GC) moments. This method is theoretically guaranteed to detect all the axes of symmetries of every 2D image, if more nonzero GC moments are used in the feature set. Furthermo re, we establish the relationship between reflectional symmetry and rotatio nal symmetry in an image, which can be used to check the correctness of sym metry detection. This method has been demonstrated experimentally using mor e than 200 images.