Photoluminescence study on coarsening of self-assembled InAlAs quantum dots on GaAs (001)

Citation
W. Zhou et al., Photoluminescence study on coarsening of self-assembled InAlAs quantum dots on GaAs (001), J ELEC MAT, 28(5), 1999, pp. 528-531
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
28
Issue
5
Year of publication
1999
Pages
528 - 531
Database
ISI
SICI code
0361-5235(199905)28:5<528:PSOCOS>2.0.ZU;2-T
Abstract
Red-emission at similar to 640 nm from self-assembled In0.55Al0.45As/Al0.5G a0.5As quantum dots grown on GaAs substrate by molecular beam epitaxy (MBE) has been demonstrated. We obtained a double-peak structure of photolumines cence (PL) spectra from quantum dots. An atomic force micrograph (AFM) imag e for uncapped sample also shows a bimodal distribution of dot sizes. From the temperature and excitation intensity dependence of PL spectra, we found that the double-peak structure of PL spectra from quantum dots was strongl y correlated to the two predominant quantum dot families. Taking into accou nt quantum-size effect on the peak energy, we propose that the high (low) e nergy peak results from a smaller (larger) dot family, and this result is i dentical with the statistical distribution of dot lateral size from the AFM image.