The magnetization measurement for annealed Co(6 Angstrom)/Cu(14 Angstrom) x
15 multilayers, evaporated on Si (1 1 1) substraie, showed easy direction
parallel to the film. The in-plane DC demagnetization remanence curve has a
minimum with amplitude much higher than the saturation remanence for magne
tic field applied perpendicular to the easy axis. This is explained as caus
ed by a portion of the sample, having negative remanence. (C) 1999 Elsevier
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