Electromagnetic fields in the cutoff regime of tapered metallic waveguides

Authors
Knoll, B Keilmann, F
Citation
B. Knoll et F. Keilmann, Electromagnetic fields in the cutoff regime of tapered metallic waveguides, OPT COMMUN, 162(4-6), 1999, pp. 177-181
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS COMMUNICATIONS
ISSN journal
00304018 → ACNP
Volume
162
Issue
4-6
Year of publication
1999
Pages
177 - 181
Database
ISI
SICI code
0030-4018(19990415)162:4-6<177:EFITCR>2.0.ZU;2-P
Abstract
We calculate electromagnetic (EM) fields in tapered metal cutoff waveguides by solving a simple system of two coupled differential equations which des cribe the incremental local reflection of the waveguide mode as the diamete r changes gradually. The results give physical insight into aperture probes used in scanning near-field optical microscopy (SNOM). The method is an ea sily installed tool for SNOM optimization. (C) 1999 Elsevier Science B.V. A ll rights reserved.