Born approximation versus the exact approach to carrier-impurity collisions in a one-dimensional semiconductor: Impact on the mobility

Citation
M. Mosko et P. Vagner, Born approximation versus the exact approach to carrier-impurity collisions in a one-dimensional semiconductor: Impact on the mobility, PHYS REV B, 59(16), 1999, pp. R10445-R10448
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
16
Year of publication
1999
Pages
R10445 - R10448
Database
ISI
SICI code
0163-1829(19990415)59:16<R10445:BAVTEA>2.0.ZU;2-M
Abstract
We study the collision of a one-dimensional (1D) electron with a screened C oulomb impurity in a single-subband GaAs quantum wire. The exact reflection probability is calculated and shown to drastically differ from the reflect ion probability in the Born approximation. As a result, both models also gi ve completly different 1D electron mobilities. Further, we introduce the ex act mean-field screening and show that except for high electron densities i t leads to a quite different reflection probability than the linear mean-fi eld (Lindhard) screening. Finally, we show that the Boltzmann 1D mobility C oncept has to be replaced by a more general semiclassical theory, if in a t ypical collision the backward reflection occurs with probability close to u nity. [S0163-1829(99)50716-9].