The use of atomic force microscopy to measure the adhesive properties of sized and unsized papers

Proof-of-principle conducted to determine the efficacy of atomic force micr oscopy (AFM) in determining the surface adhesive energy distributions of si zed and unsized papers. Local pull-off forces removing a polystyrene bead f rom the surface of paper samples are measured as a function of position on the paper surface. Energy distributions are found to be brood in all cases, but the effect of sizing is to "remove" the high-energy portions of the pa per surface. Increased sizing levels produce decreases in area average pull -off force and increases in the contact angle of water against the paper.