Optical and structural evidence of the grain-boundary influence on the disorder of polycrystalline CdTe films

Citation
A. Iribarren et al., Optical and structural evidence of the grain-boundary influence on the disorder of polycrystalline CdTe films, APPL PHYS L, 74(20), 1999, pp. 2957-2959
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
20
Year of publication
1999
Pages
2957 - 2959
Database
ISI
SICI code
0003-6951(19990517)74:20<2957:OASEOT>2.0.ZU;2-I
Abstract
We report the linear behavior of the band-tail parameter as a function of t he reciprocal of the grain size in polycrystalline CdTe. On the other hand, the study of the full width at half maximum of the x-ray diffraction peak shows a similar behavior, which indicates that the disorder increases as gr ain size diminishes. A theoretical analysis justifies that the behavior is ruled by the contribution of the grain-boundary traps, and the trap concent ration is calculated. Both results constitute experimental evidences of the grain-boundary disorder, which was quantified, and demonstrate that it is caused by the extension of the grain- boundary effect into the grain. (C) 1 999 American Institute of Physics. [S0003-6951(99)04420-4].