Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction

Citation
I. Kegel et al., Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction, APPL PHYS L, 74(20), 1999, pp. 2978-2980
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
20
Year of publication
1999
Pages
2978 - 2980
Database
ISI
SICI code
0003-6951(19990517)74:20<2978:LOOCGI>2.0.ZU;2-N
Abstract
We have applied triple-crystal grazing incidence diffraction to self-assemb led islands on a Ge/Si(001) superlattice. Lateral ordering in the near-surf ace region is evaluated from reciprocal space mappings around different sur face reflections. The observed intensities are explained by the short-range order strain modulation of the lattice parameter in the substrate induced by coherent Ge islands. We find the island-induced strain modulation to be arranged in a local square lattice. A nearest neighbor disorder parameter, the size distribution of the islands, and a correlation length are obtained from the presented model. (C) 1999 American Institute of Physics. [S0003-6 951(99)01820-3].