Empirical infection period models for tan spot of wheat

Citation
Ed. De Wolf et Lj. Francl, Empirical infection period models for tan spot of wheat, CAN J PL P, 20(4), 1998, pp. 394-395
Citations number
5
Categorie Soggetti
Plant Sciences
Journal title
CANADIAN JOURNAL OF PLANT PATHOLOGY-REVUE CANADIENNE DE PHYTOPATHOLOGIE
ISSN journal
07060661 → ACNP
Volume
20
Issue
4
Year of publication
1998
Pages
394 - 395
Database
ISI
SICI code
0706-0661(199812)20:4<394:EIPMFT>2.0.ZU;2-Z
Abstract
Infection period models for Pyrenophora tritici-repentis were evaluated for their potential use in a tan spot forecasting system. Infection periods on susceptible wheat were identified from a bioassay system that correlated t an spot incidence with crop growth stage and 24 h summaries of environmenta l data including temperature, relative humidity, wind speed, wind direction , solar radiation, precipitation and flat-plate type wetness sensor resista nce. The resulting data set was then divided for model calibration and vali dation analysis. Artificial neural networks, logistic regression, and discr iminant functions were used to classify infection periods. A neural network model had a prediction accuracy of 87% for infection periods of a validati on data set. In comparison, stepwise logistic regression correctly predicte d 69% and multivariate discriminant analysis distinguished 50% of the valid ation cases. When wetness sensor inputs were withheld from the models, both the neural network and logistic regression declined 6% in prediction accur acy. Prediction accuracy was lower when validation cases from the 1996 envi ronment were used to assess model accuracy.