Planning step-stress life-test with a target acceleration-factor

Authors
Citation
Kp. Yeo et Lc. Tang, Planning step-stress life-test with a target acceleration-factor, IEEE RELIAB, 48(1), 1999, pp. 61-67
Citations number
11
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON RELIABILITY
ISSN journal
00189529 → ACNP
Volume
48
Issue
1
Year of publication
1999
Pages
61 - 67
Database
ISI
SICI code
0018-9529(199903)48:1<61:PSLWAT>2.0.ZU;2-J
Abstract
A sequential approach is presented to plan a multiple-steps step-stress acc elerated life test (SSALT) with type-I censoring so as to achieve a pre-spe cified acceleration factor. An initial optimal plan for a simple SSALT, whe re one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained no n-linear program. A backward recursion scheme generates the subsequent opti mal low-stress levels and hold-times for multiple-step SSALT. An illustrati on using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the meth od under 2-step and 3-step SSALT.