A sequential approach is presented to plan a multiple-steps step-stress acc
elerated life test (SSALT) with type-I censoring so as to achieve a pre-spe
cified acceleration factor. An initial optimal plan for a simple SSALT, whe
re one not only has to determine the optimum hold-time under low stress but
also the optimum low stress level, is obtained by solving a constrained no
n-linear program. A backward recursion scheme generates the subsequent opti
mal low-stress levels and hold-times for multiple-step SSALT. An illustrati
on using a 3-step SSALT is presented. The relative efficiency of the 2-step
and 3-step SSALT is investigated. A numerical example illustrates the meth
od under 2-step and 3-step SSALT.