The thin-film dielectric response of organic films confined within a surfac
e forces apparatus (SFA) and also between parallel sheets of atomically smo
oth mica is reported for the first time. Analysis is presented to infer die
lectric properties of the organic film from the measured capacitance of the
total system: sample, and mica sheets intervening between sample and elect
rodes. Measurements concerned the frequency dependence of normal-mode diele
ctric relaxation of cis-polyisoprene having dipoles aligned in the same dir
ection along the chain backbone. We find that in thin-film geometries the p
eak frequency, f(peak), of normal mode dielectric loss (epsilon") is modera
tely lower than for bulk samples and that, more important, the expected ter
minal tail, observed in the bulk sample (epsilon"proportional to f for f <
f(peak)), is not observed even at the lowest frequency examined. Thus the s
low normal mode distribution is much broader and the terminal relaxation ti
me is much longer for chains in the thin layers. These dielectric features
are attributed to spatial constraints on global chain motion in the thin la
yers and also to adsorption of chains on mica surfaces when the layer thick
ness is comparable to the unperturbed chain dimension. Independent measurem
ents of shear relaxation, performed using a SFA modified for measurement of
dynamical mechanical shear rheology, found a tremendously retarded viscoel
astic response relative to bulk samples. There is the possibility that the
broad distribution of the dielectric response of individual polymer chains
may correspond to the observed retarded viscoelastic relaxation. However, w
e cannot rule out the other possibility that the dielectrically detected re
laxation of individual chains is still faster than the terminal viscoelasti
c relaxation and that the latter thus corresponds to the collective motion
of many confined chains. (C) 1999 American Institute of Physics. [S0021-960
6(99)50419-4].