Copper selenide thin films by chemical bath deposition

Citation
Vm. Garcia et al., Copper selenide thin films by chemical bath deposition, J CRYST GR, 203(1-2), 1999, pp. 113-124
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
203
Issue
1-2
Year of publication
1999
Pages
113 - 124
Database
ISI
SICI code
0022-0248(199905)203:1-2<113:CSTFBC>2.0.ZU;2-2
Abstract
We report the structural, optical, and electrical properties of thin films (0.05 to 0.25 mu m) of copper selenide obtained from chemical baths using s odium selenosulfate or N,N-dimethylselenourea as a source of selenide ions. X-ray diffraction (XRD) studies on the films obtained from baths using sod ium selenosulfate suggest a cubic structure as in berzelianite, Cu2-xSe wit h x = 0.15. Annealing the films at 400 degrees C in nitrogen leads to a par tial conversion of the films to Cu,Se. In the case of films obtained from t he baths containing dimethylselenourea, the XRD patterns match that of kloc kmannite, CuSe. Annealing these films in nitrogen at 400 degrees C results in loss of selenium, and consequently a composition rich in copper, similar to Cu2-xSe, is reached. Optical absorption in the films result from free c arrier absorption in the near infrared region with absorption coefficient o f similar to 10(5) cm(-1). Band-to-band transitions which gives rise to the optical absorption in the visible-ultraviolet region may be interpreted in terms of direct allowed transitions with band gap in the 2.1-2.3 eV range and indirect allowed transitions with band gap 1.2-1.4 eV. All the films, a s prepared and annealed, show p-type conductivity, in the range of (1-5) x 10(3) Omega(-1) cm(-1). This results in high near infrared reflectance, of 30-80%. (C) 1999 Elsevier Science B.V. All rights reserved.