Mw. Cho et al., Molecular beam epitaxy growth of Be-chalcogenides and fabrication of ZnSe ZnMgBeSe laser structures, J CRYST GR, 202, 1999, pp. 957-960
We have carried out detailed investigation on the growth of Be-chalcogenide
s alloys and evaluated the device characteristics of optically pumped ZnSe/
ZnMgBeSe SQW. A lattice-matched ZnMgBeSe (E-g = 2.975 eV) layer shows a nar
rower X-ray diffraction (XRD) peak, the FWHM (full-width at half-maximum) v
alue of which is 21 arcsec. The variation of FWHM of X-ray rocking curve (X
RC) due to lattice misfit is investigated for ZnMgBeSe quaternaries with va
rious lattice misfits extending from compressive-to-tensile strain, which s
hows that the FWHM value under compressive strain increases more steeply wi
th lattice misfit than that under tensile strain. We report on the opticall
y pumped lasing of a ZnSe/ZnMgBeSe single quantum well at 444 nm with a low
threshold of 16 kW/cm(2) at room temperature and high-temperature lasing u
p to 473 K. The characteristic temperature is estimated to be 166 K from th
e exponential relation between threshold and temperature. (C) 1999 Elsevier
Science B.V. All rights reserved.