In this paper, we present the study of the growth conditions of metamorphic
GaAs on InP(0 0 1) substrate using gas source molecular beam epitaxy (GSMB
E). We examined the influence of various growth parameters, such as growth
temperature and Group V pressure, and determined optimized conditions to pr
oduce low roughness (11.6 Angstrom rms) GaAs. We also demonstrate the exist
ence of a critical thickness limit under which dislocations are generated,
or propagate, in the substrate. We experimented different types of post-gro
wth cooling rates, annealing and observed their influence on the localizati
on of the substrate dislocations. Altogether, these experiments indicate th
at the metamorphic growth of GaAs on InP is a valid approach for long wavel
ength vertical cavity surface emitting lasers. (C) 1999 Elsevier Science B.
V. All rights reserved.