Atomic force microscopy study of silica nanopowder compacts

Citation
S. Harrington et al., Atomic force microscopy study of silica nanopowder compacts, J MATER SCI, 34(9), 1999, pp. 2075-2079
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
34
Issue
9
Year of publication
1999
Pages
2075 - 2079
Database
ISI
SICI code
0022-2461(19990501)34:9<2075:AFMSOS>2.0.ZU;2-5
Abstract
Nanometer silica powders compacted at different pressures have been studied by atomic force microscopy (AFM). Local elastic moduli measurements made o n the powder compacts yield values smaller than that of bulk silica. Loadin g force-distance curves measured show break points at some critical pressur es. AFM images obtained at constant contact forces above and below the crit ical force at which a break point occured show the break point was a result of AFM tip plowing into the nanometer powder compacts. The applied force r equired for break points to occur increases with sample density. Such a beh avior has been qualitatively explained in terms of adhesion force between n anoparticle and sample surface morphology. (C) 1999 Kluwer Academic Publish ers.