High-temperature X-ray diffraction and dilatometric studies on some oxygenion conducting compounds

Citation
Sn. Achary et al., High-temperature X-ray diffraction and dilatometric studies on some oxygenion conducting compounds, J MAT SCI L, 18(5), 1999, pp. 355-357
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
18
Issue
5
Year of publication
1999
Pages
355 - 357
Database
ISI
SICI code
0261-8028(19990301)18:5<355:HXDADS>2.0.ZU;2-B