Chloride uptake by oxide covered aluminum as determined by X-ray photoelectron and X-ray absorption spectroscopy

Citation
Pm. Natishan et al., Chloride uptake by oxide covered aluminum as determined by X-ray photoelectron and X-ray absorption spectroscopy, J ELCHEM SO, 146(5), 1999, pp. 1737-1740
Citations number
30
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
00134651 → ACNP
Volume
146
Issue
5
Year of publication
1999
Pages
1737 - 1740
Database
ISI
SICI code
0013-4651(199905)146:5<1737:CUBOCA>2.0.ZU;2-F
Abstract
The uptake of chloride by aluminum polarized at potentials below (less posi tive than) the pitting potential in 0.1 M NaCl solutions was studied using X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (X AS). The XPS chloride spectra showed that-two distinct sets of doublets are present. One doublet is related to chloride on the surface and the second is related to chloride incorporated in the oxide film. In the case of XAS, deconvolution of the spectrum obtained for samples polarized below the pitt ing potential also showed the presence of chloride in the near surface regi on and in the oxide film. The important point of this work is that the obse rved chloride was present in two different chemical environments as determi ned with both XAS and XPS. (C) 1999 The Electrochemical Society. S0013-4651 (98)07-030-X. All rights reserved.