Hydrous Ir oxide films have been studied using cyclic voltammetry, ac imped
ance, and ellipsometric techniques. Under certain conditions of exposure af
ter oxide growth, an irreversible decrease of the Ir(+III)/Ir(+IV) conversi
on kinetics, also referred to as irreversible film aging, is observed. Howe
ver, these films are thermodynamically not unaltered and the film charge is
not lost during aging. Aging of Ir oxide films involves the detachment of
oxide segments from the Ir substrate and/or cracking within the oxide itsel
f. This leads to an increase in the characteristic transport length and a p
ossible explanation of the altered kinetics. Furthermore, Ir oxide film agi
ng can be prevented, depending on the conditions employed to grow and subse
quently study them. (C) 1999 The Electrochemical Society. S0013-4651(98)06-
001-7. All rights reserved.