Measurement of electron energy distribution function in an argon copper plasma for ionized physical vapor deposition

Citation
Zc. Lu et al., Measurement of electron energy distribution function in an argon copper plasma for ionized physical vapor deposition, J VAC SCI A, 17(3), 1999, pp. 840-844
Citations number
28
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
17
Issue
3
Year of publication
1999
Pages
840 - 844
Database
ISI
SICI code
0734-2101(199905/06)17:3<840:MOEEDF>2.0.ZU;2-O
Abstract
The electron energy distribution function (EEDF) has been measured under a variety of conditions in an Ar/Cu plasma for ionized physical vapor deposit ion. The EEDF is directly measured in a system including a direct-current m agnetron sputter source for copper and a radio frequency (rf) induction pla sma, using a Langmuir probe with a modulated bias voltage in combination wi th a lock-in amplifier. The experimental data indicate that at fixed rf ion ization power, the electron population in the tail of the EEDF is depleted by the introduction of copper vapor, and the electron average energy decrea ses slightly. Observed changes in the EEDF are attributed to inelastic coll isions with copper atoms, which have lower threshold energies for excitatio n and ionization as well as larger cross sections as compared to argon, and the resulting reduction in the measured plasma potential. (C) 1999 America n Vacuum Society. [S0734-2101(99)02203-4].