Whispering gallery modes were used for very accurate permittivity and diele
ctric loss measurements of ultralow loss isotropic and uniaxially anisotrop
ic single crystals. Several materials including sapphire, YAG, quartz, and
SrLaAlO4 were measured. The total absolute uncertainty in the real part of
permittivity tensor components was estimated to be +/-0.1%, limited princip
ally by the uncertainty in sample dimensions. Imaginary parts of permittivi
ties were measured with uncertainties of about 10%, limited by the accuracy
of e-factor measurements of whispering gallery modes. It has been observed
that, for most crystals, dielectric losses can be approximated by a power
function of absolute temperature only in limited temperature ranges. At tem
peratures between 4-50 K, losses are often affected by impurities, which ar
e always present in real crystals.