Two-dimensional simulation of thin-film silicon solar cells with innovative device structures

Citation
M. Goldbach et al., Two-dimensional simulation of thin-film silicon solar cells with innovative device structures, PROG PHOTOV, 7(2), 1999, pp. 85-100
Citations number
25
Categorie Soggetti
Environmental Engineering & Energy
Journal title
PROGRESS IN PHOTOVOLTAICS
ISSN journal
10627995 → ACNP
Volume
7
Issue
2
Year of publication
1999
Pages
85 - 100
Database
ISI
SICI code
1062-7995(199903/04)7:2<85:TSOTSS>2.0.ZU;2-9
Abstract
We investigate the optical and electrical properties of thin-film silicon s olar cells by means of numerical simulations. The optical design under inve stigation is the encapsulated-V texture, which is capable of absorbing sunl ight corresponding to a maximum short-circuit current density of 35 mA cm(- 2). Because the layer thickness can be restricted to only 4 mu m, the encap sulated-V structure also provides a good collection efficiency for photogen erated charge carriers. The results for our simulations suggest that practi cal efficiencies above 12% can be expected for Si material with a minority carrier lifetime as low as 10 ns. Increased lifetimes of 100 ns allow for a bout 14% efficiency. The benefit of multiple junctions within the device st ructure strongly depends on surface recombination. The efficiency of a sing le-junction cell can by improved by more the 3% absolute with a multi-junct ion device if the surface combination velocity is as high as 10(5) cm s(-1) . For moderate surface recombination, the gain is only 1%. Copyright (C) 19 99 John Wiley & Sons, Ltd.