This paper is devoted to elaboration and investigation of ultraviolet photo
detector (UVPD) on the basis of heterojunctions of A(3)B(5) semiconductor/t
ransparent conducting layer with microrelief interface. The methods of rand
om microrelief of desirable morphology fabrication for (100) GaAs and InP s
urfaces are described. AFM images of GaAs and InP surfaces with optimal mic
rorelief are presented as well. The spectral responses of Au/(GaAs, InP) an
d ITO/GaAs photodetectors in the spectral range from 0.25 to 0.5 mu m in de
pendence on the interface microrelief morphology and passivating treatments
have been investigated. Photodetectors with enhanced UV response at lambda
= 0.26-0.40 mu m have been obtained on the basis of Au/GaAs (S-lambda = 0.
17-0.21 A/W) and Au/InP (S-lambda = 0.12-0.23 A/W) heterostructures by the
developed technology of interface texturation and passivation. (C) 1999 Els
evier Science S.A. All rights reserved.