Pulsed force mode: a new method for the investigation of surface properties

Authors
Krotil, HU Stifter, T Waschipky, H Weishaupt, K Hild, S Marti, O
Citation
Hu. Krotil et al., Pulsed force mode: a new method for the investigation of surface properties, SURF INT AN, 27(5-6), 1999, pp. 336-340
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE AND INTERFACE ANALYSIS
ISSN journal
01422421 → ACNP
Volume
27
Issue
5-6
Year of publication
1999
Pages
336 - 340
Database
ISI
SICI code
0142-2421(199905/06)27:5-6<336:PFMANM>2.0.ZU;2-9
Abstract
Scanning force microscopy is extended by the pulsed force mode from simple imaging of topography to measuring elastic, electrostatic and adhesive samp le properties. Lateral forces are virtually eliminated so that mapping of d elicate samples with high resolution in air and fluids is easily possible. Scanning speed is comparable to that in contact mode, The new opportunities for scanning force microscopy given by the pulsed force mode is demonstrat ed in selected applications. Copyright (C) 1999 John Wiley & Sons, Ltd.