Ligand-stabilized Au,, clusters were prepared on Au(111) surfaces and inves
tigated by electrical force microscopy (EFM) in dynamic non-contact mode, w
hich allows the detection of d.c. potential differences between tip and sam
ple as well as the tip-sample capacitance. This work explains the measureme
nt procedure and presents the observed C(U) characteristics of the special
sample system. Copyright (C) 1999 John Wiley & Sons, Ltd.