Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)

Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-relat ed technique originally introduced to study the surface elastic properties of stiff materials. We report elastic images of heterogeneous nanostructure s with a lateral resolution of the order of a few nanometres. One of the ma in intentions of this paper is not only to show the capability of UFM to al low one to image surface elastic properties of stiff materials but also to show that UFM can be applied to relatively soft materials with reproducible and interpretable results. The samples presented were chosen over a wide r ange of stiffness values (with Young's modulus E = 0.1-400 GPa): very stiff silicon carbide fibres embedded in a mullite matrix, less stiff carbon fib res embedded in an epoxy matrix and relatively compliant rubber inclusions in a polymethylmethacrylate matrix. A discussion of the conditions required to obtain unambiguous data is also provided. Results obtained using the mo re traditional force modulation mode are also presented and compared with t he UFM images of the same samples. Copyright (C) 1999 John Wiley & Sons, Lt d.