AFM and optical investigations of SERS-active silver electrodes

Citation
S. Kruszewski et T. Kobiela, AFM and optical investigations of SERS-active silver electrodes, VACUUM, 54(1-4), 1999, pp. 245-249
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
54
Issue
1-4
Year of publication
1999
Pages
245 - 249
Database
ISI
SICI code
0042-207X(199907/09)54:1-4<245:AAOIOS>2.0.ZU;2-5
Abstract
The paper presents the results of optical and AFM measurements of SERS-acti ve silver electrodes. The intensity of specularly reflected light from thes e electrodes was measured and next, the rms roughness determined. The value s of rms roughness of these electrodes were also determined from their AFM profiles. The origins of observed divergences are discussed. (C) 1999 Elsev ier Science Ltd. All rights reserved.