The paper presents the results of optical and AFM measurements of SERS-acti
ve silver electrodes. The intensity of specularly reflected light from thes
e electrodes was measured and next, the rms roughness determined. The value
s of rms roughness of these electrodes were also determined from their AFM
profiles. The origins of observed divergences are discussed. (C) 1999 Elsev
ier Science Ltd. All rights reserved.