Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis
Cu. Ro et al., Assessment of homogeneity of candidate reference material at the nanogram level and investigation on representativeness of single particle analysis using electron probe X-ray microanalysis, ANALYT CHIM, 389(1-3), 1999, pp. 151-160
Particulate samples of a candidate reference material are evaluated on thei
r homogeneity from bottle to bottle using electron probe X-ray microanalysi
s technique. The evaluation on the homogeneity is done by the utilization o
f the Kolmogorov-Smirnov statistics to the processing of the quantitative e
lectron probe X-ray microanalysis data. Due to a limitation, existing even
in computer controlled electron probe X-ray microanalysis, in terms of anal
ysis time and expenses, the number of particles analyzed is much smaller co
mpared to that in the sample. Therefore, it is investigated whether this te
chnique provides representative analysis results for the characteristics of
the sample, even though a very small portion of the sample is really analy
zed. Furthermore, the required number of particles for the analysis to insu
re a certain level of reproducibility, e.g. 5% relative standard deviation,
is determined by the application of the Ingamells sampling theory. (C) 199
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