High mobility two-dimensional electron gas in AlGaN GaN heterostructures grown by plasma-assisted molecular beam epitaxy

Citation
Cr. Elsass et al., High mobility two-dimensional electron gas in AlGaN GaN heterostructures grown by plasma-assisted molecular beam epitaxy, APPL PHYS L, 74(23), 1999, pp. 3528-3530
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
23
Year of publication
1999
Pages
3528 - 3530
Database
ISI
SICI code
0003-6951(19990607)74:23<3528:HMTEGI>2.0.ZU;2-R
Abstract
High quality AlGaN/GaN heterostructures have been grown by radio-frequency plasma-assisted molecular beam epitaxy on n-type GaN templates grown on sap phire by metal organic chemical vapor deposition. The unintentionally doped Al0.12Ga0.88N/GaN heterostructure exhibits a 77 K Hall mobility of 14 500 cm(2)/Vs and a 12 K mobility of 20 000 cm(2)/Vs (n(s) = 5.0 X 10(12) cm(-2) ). A room temperature mobility of 1860 cm(2)/Vs (n(s) = 4.8 X 10(12) cm(-2) ) was calculated for the two-dimensional electron gas channel using a two l ayer model from the measured mobility for the whole structure (template plu s heterostructure). Magnetoresistance measurements at 4.2 K showed well-res olved Shubnikov-de Haas oscillations, which began at 2.6 T. (C) 1999 Americ an Institute of Physics. [S0003-6951(99)00223-5].