F. Steuber et al., Reduced operating voltage of organic electroluminescent devices by plasma treatment of the indium tin oxide anode, APPL PHYS L, 74(23), 1999, pp. 3558-3560
The impact of oxygen plasma treatment of indium tin oxide anodes on perform
ance and durability of vapor-deposited organic electroluminescent devices i
s shown. Investigations focused on the long-term stability using driving co
nditions suitable for passive matrix driven displays. Reliability studies o
f solvent only cleaned samples indicate the presence of a predominating deg
radation process at the interface between indium tin oxide and the hole inj
ection layer which results in a drastic rise of the operating voltage. This
voltage increase could be reduced to 0.31 mV/h by oxygen plasma treatment.
As hole injection layer copper phthalocyanine is compared with a star-shap
ed amine derivative. (C) 1999 American Institute of Physics. [S0003-6951(99
)04423-X].