Signal-to-noise-ratio (SNR) of X-ray imaging scintillators determined by luminescence measurements

Authors
Cavouras, D Kandarakis, I Kanellopoulos, M Nomicos, CD Panayiotakis, GS
Citation
D. Cavouras et al., Signal-to-noise-ratio (SNR) of X-ray imaging scintillators determined by luminescence measurements, APPL RAD IS, 51(1), 1999, pp. 59-68
Citations number
22
Categorie Soggetti
Multidisciplinary
Journal title
APPLIED RADIATION AND ISOTOPES
ISSN journal
09698043 → ACNP
Volume
51
Issue
1
Year of publication
1999
Pages
59 - 68
Database
ISI
SICI code
0969-8043(199907)51:1<59:S(OXIS>2.0.ZU;2-#
Abstract
A new method for studying the signal-to-noise-ratio (SNR) of X-ray imaging scintillators was developed. SNR was expressed in terms of the X-ray lumine scence efficiency (XLE) the X-ray to emitted light conversion efficiency an d the mean light photon energy. Laboratory prepared Gd2O2S:Tb, La2O2S:Tb an d Y2O2S:Tb scintillator screens were tested and best results were obtained for the 80 mg/cm(2) Gd2O2S:Tb screen. The method proposed allows for scinti llator comparison on the basis of XLE and wavelength measurements. (C) 1999 Elsevier Science Ltd. All rights reserved.