Several analytical methods of electron, X-ray and ion microscopy are now ca
pable of generating images containing an entire spectrum at each pixel. The
se spectrum-images require new software tools for visualisation, classifica
tion and analysis. This paper outlines a new method of visualisation for sp
ectrum-images and two image classification methods that can be used to iden
tify the phases present in the sample. (C) 1999 Elsevier Science B.V. All r
ights reserved.