Relation between the shape of measured loss function and the resolution ofthe XPS spectrum

Authors
Citation
M. Jo, Relation between the shape of measured loss function and the resolution ofthe XPS spectrum, APPL SURF S, 145, 1999, pp. 49-53
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
145
Year of publication
1999
Pages
49 - 53
Database
ISI
SICI code
0169-4332(199904)145:<49:RBTSOM>2.0.ZU;2-V
Abstract
The loss function of Ag has been calculated using a 3d(3/2) and 3d(5/2) pai r of relatively high resolution XPS spectrum. The structure of the loss fun ction is in a good agreement with structures reported so far, except for th e existence of the smallest energy peak. It is demonstrated that the loss f unction thus obtained from a spectrum measured using a selected resolution can provide backgrounds for other spectra no matter at what resolution they were taken. Conversely, a question arises if it is possible to extract the same loss function directly from a very poorly resolved spectrum. The pres ent results show that, at least, some structure is indeed restored despite the increased numerical difficulty in finding the optimum solution. (C) 199 9 Elsevier Science B.V. All rights reserved.